The ultimate real time wafer mapping and Prober control system.
SE-Probe allows you to streamline the production process by adding
modern features to your existing wafer Prober and offers you the latest
technical solutions in the field of probing.

 key features,

• Real time wafer mapping.
• data management tools.
• Real time production control. (yield, alarms)
• Support for Multi-site test, up to 32 dice.
• Multiple level probing. (sampling)
• Standard Windows networking.
• Remote monitoring.
• Ink-less probing.
• Off-line inking.

 is an open system,

which means that you can easily hook into certain events.
Customer extension libraries can change the standard functionality of SE-Probe.
This allows the customer to change and/or add functionality to the existing system.
The possibilities of this sophisticated system are almost unlimited.
For example, you can integrate your Prober into the
company's data analysis and production flow network.
Create sophisticated wafer analysis software to detect problem areas
on your wafers potentially indicating Fabrication problems.

Click here to download informational brochure on SE-Probe.

MarTek, Inc. is not affiliated with Electroglas Inc. in any manner.

© 2001 Copyright MarTek, Inc., 112 South Rockford Drive Suite #103, Tempe, AZ 85281
tel: (480) 947-5757 fax: (480) 967-5757. Send comments and inquiries to info@martekprober.com.
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