MarTek is pleased to offer you this exciting newsletter
about upgrading your existing Electroglas Wafer Probers offering Wafer Mapping,
Visual Defect Inspection, Stepping Accuracy and Optical Character Recognition (OCR) solutions.
More Info.

 

SE-PROBEReal Time Wafer Mapping and Networking using a Windows Platform.
SE-Probe offers the latest technical solution in the field of probing such as: real time
graphical wafer mapping, off-line inking, networking, 32 site multi-die testing
real time production monitoring/control and data management tools. 
More Info.

 

VK-MAR OCR – Optical Character Recognition with 99.99 read accuracy with read times less than 0.5 Seconds.
VK-MAR OCR is a Windows software based high speed character recognition system.
It also supports SEMI two dimensional matrix, radial (arc) scribe read and bar-code.
VK-MAR OCR can read ID codes at any process step despite degradations
from EBR, metallization and other process defects.
More Info.

 

PERISIGHT - Precision Positioning System – Specifically Designed for Electroglas Probers.
Perisight is a robust “closed loop” precision measurement system which improves probing
accuracy of Electroglas 2000, 3000, and 4085 series wafer probers. It resides undetected
optically measuring the position of the die and correcting the X and Y axes to
achieve realistic accuracy of 4.0 microns or less.
More Info.

 

MarTek, Inc. is not affiliated with Electroglas Inc. in any manner.

© 2001 Copyright MarTek, Inc., 112 South Rockford Drive Suite #103, Tempe, AZ 85281
tel: (480) 947-5757 fax: (480) 967-5757. Send comments and inquiries to
info@martekprober.com.
Site best viewed at 800x600 display resolution on IE5 or above. Photos by Richard Topalovich.